~Metrological Test Station for CCD Arrays~

Differntial measurement system for in-cryostat 9-CCD flatness measurement. Uses two Keyence absolute-distance laser triangulation sensors to compare the surface height of the surface under test (CCD array imaging surface) to an optical reference flat. Concept: Peter Takacs.

Diagram of test station.

Another view showing Test/Commissioning Cryostat and utility cart being lowered onto stand.

optical reference stage
Detail of kinematic adjustment mechanism on optical reference stage.

In operation with Jadzia.

Another view.